SQJ-IA型便攜式氣體檢測儀 是濟南市長清計算機應用公司研制的便攜式檢測儀器,嚴格遵循國家標準要求制造,通過了國家消防電子產品質量監督檢驗中心的檢驗。主要技術指標:
1、 檢測原理:催化燃燒式
2、 檢測對象:天然氣、液化氣、氫氣等可燃氣體
3、 檢測方式:自由擴散式
4、 檢測范圍:0-100%LEL或ppm級
5、 基本誤差:≤±5% F.S
6、 響應時間:<15s
7、 報警方式:聲、光報警
8、 顯示方式:三位半、發光條或液晶顯示
9、 防爆型式:本質安全型
10、 防爆標志: ExiaIICT3
11、 工作電源:特制可充電池,3.6V鋰電池
12、 功 耗:<1mW(常溫下)
13、 溫度范圍:-40℃~+70℃
6901-01 | NITRIC ACID | 超純硝酸(ppt級) | 1L | ¥9,664 |
6901-02 | NITRIC ACID | 超純硝酸(ppt級) | 2L | ¥15,301 |
6901-05 | NITRIC ACID | 超純硝酸(ppt級) | 500ML | ¥5,646 |
TEST | SPECIFICATION |
For Laboratory,Research,or Manufacturing Use | |
Assay (HNO₃)(w/w) | 67 - 70 % |
Trace Impurities - Aluminum (Al) | <= 20 ppt |
Trace Impurities - Antimony (Sb) | <= 10 ppt |
Trace Impurities - Arsenic (As) | <= 20 ppt |
Trace Impurities - Barium (Ba) | <= 10.0 ppt |
Trace Impurities - Beryllium (Be) | <= 10.0 ppt |
Trace Impurities - Bismuth (Bi) | <= 10.0 ppt |
Trace Impurities - Boron (B) | <= 20 ppt |
Trace Impurities - Cadmium (Cd) | <= 10 ppt |
Trace Impurities - Calcium (Ca) | <= 20 ppt |
Trace Impurities - Cerium (Ce) | <= 10.0 ppt |
Trace Impurities - Cesium (Cs) | <= 10.0 ppt |
Trace Impurities - Chromium (Cr) | <= 20 ppt |
Trace Impurities - Cobalt (Co) | <= 10 ppt |
Trace Impurities - Copper (Cu) | <= 20 ppt |
Trace Impurities - Dysprosium (Dy) | <= 1 ppt |
Trace Impurities - Erbium (Er) | <= 1 ppt |
Trace Impurities - Europium (Eu) | <= 1 ppt |
Trace Impurities - Gadolinium (Gd) | <= 1 ppt |
Trace Impurities - Gallium (Ga) | <= 10 ppt |
Trace Impurities - Germanium (Ge) | <= 10 ppt |
Trace Impurities - Gold (Au) | <= 20 ppt |
Trace Impurities - Hafnium (Hf) | <= 10 ppt |
Trace Impurities - Holmium (Ho) | <= 1 ppt |
Trace Impurities - Indium (In) | <= 1 ppt |
Trace Impurities - Iron (Fe) | <= 20 ppt |
Trace Impurities - Lanthanum (La) | <= 1 ppt |
Trace Impurities - Lead (Pb) | <= 10.0 ppt |
Trace Impurities - Lithium (Li) | <= 10 ppt |
Trace Impurities - Lutetium (Lu) | <= 1 ppt |
Trace Impurities - Magnesium (Mg) | <= 10 ppt |
Trace Impurities - Manganese (Mn) | <= 10 ppt |
Trace Impurities - Mercury (Hg) | <= 100 ppt |
Trace Impurities - Molybdenum (Mo) | <= 10.0 ppt |
Trace Impurities - Neodymium (Nd) | <= 1 ppt |
Trace Impurities - Nickel (Ni) | <= 50 ppt |
Trace Impurities - Niobium (Nb) | <= 1 ppt |
Trace Impurities - Palladium (Pd) | <= 20 ppt |
Trace Impurities - Platinum (Pt) | <= 20 ppt |
Trace Impurities - Potassium (K) | <= 10 ppt |
Trace Impurities - Praseodymium (Pr) | <= 1 ppt |
Trace Impurities - Rhenium (Re) | <= 10 ppt |
Trace Impurities - Rhodium (Rh) | <= 10 ppt |
Trace Impurities - Rubidium (Rb) | <= 10 ppt |
Trace Impurities - Ruthenium (Ru) | <= 20 ppt |
Trace Impurities - Samarium (Sm) | <= 1 ppt |
Trace Impurities - Scandium (Sc) | <= 10 ppt |
Trace Impurities - Selenium (Se), For Information Only | |
Trace Impurities - Silver (Ag) | <= 10 ppt |
Trace Impurities - Sodium (Na) | <= 10 ppt |
Trace Impurities - Strontium (Sr) | <= 10 ppt |
Trace Impurities - Tantalum (Ta), For Information Only | |
Trace Impurities - Tellurium (Te) | <= 1 ppt |
Trace Impurities - Terbium (Tb) | <= 1 ppt |
Trace Impurities - Thallium (Tl) | <= 10.0 ppt |
Trace Impurities - Thorium (Th) | <= 1 ppt |
Trace Impurities - Thulium (Tm) | <= 1 ppt |
Trace Impurities - Tin (Sn) | <= 20 ppt |
Trace Impurities - Titanium (Ti) | <= 10.0 ppt |
Trace Impurities - Tungsten (W) | <= 10.0 ppt |
Trace Impurities - Uranium (U) | <= 1 ppt |
Trace Impurities - Vanadium (V) | <= 10.0 ppt |
Trace Impurities - Ytterbium (Yb) | <= 1 ppt |
Trace Impurities - Yttrium (Y) | <= 1 ppt |
Trace Impurities - Zinc (Zn) | <= 20 ppt |
Trace Impurities - Zirconium (Zr) | <= 10 ppt |
Certificate Provided Reports Actual Lot Analysis |
N-1501 | Brain Injury Derived Neurotrophic Peptide BINP | H-Glu-Ala-Leu-Glu-Leu-Ala-Arg-Gly-Ala-Ile-Phe-Gln-Ala-NH2 | |
N-1502 | Neurotrophic Factor for Retinal Cholinergic Neurons | H-Tyr-Leu-Leu-Pro-Ala-Gln-Val-Asn-Ile-Asp-OH |
測定范圍: | 0.1Pa.s~200Pa.s |
測量誤差: | ±3% |
轉子規格: | 21、27、28、29號 轉子 |
溫度范圍: | 室溫+15~200℃ |
溫控誤差: | ±0.1℃ |